Articol #1236 ianuarie 2020
Experimental stand of absorption measurements in the 8.6 - 9.5 GHz range for very thin samples with offset of the reflected wave phase
Revista/Volum: Conference on Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies X, Book Series: Proceedings of SPIE-The International Society for Optical Engineering Volume: 11718 Article Number: 117181T Published: 31 December 2020 0277-786X
Constantin Hutanu