Articol #1290 august 2002
X-ray diffractometry applied to ancient metals investigation
Revista/Volum: Proc. SPIE. 5227, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies, 2003. 0277-786X;:9780819483300
Manuella Kadar Ioan Ileana Maria Popa