• Articol #4473 ianuarie 2022

    Novel ceramic plate defect detection using YOLO- R
    Revista/Volum: Proceedings of 14th International Conference on Electronics, Computers and Artificial Intelligence (ECAI-2022) 30 June-1 July 2022; Ploiesti, Romania Electronic ISBN:978-1-6654-9535-6; USB ISBN:978-1-6654-9534-9; (PoD) ISBN:978-1-6654-9536-3

    Tulbure Andrei-A. Covaciu C. Szabo I. Tulbure Adrian-A. Dulf Eva

    DOI: https://doi.org/10.1109/ECAI54874.2022.9847431