Articol #1186 august 2018

Non-destructive analysis of manufacturing defects for building materials
Revista/Volum: Proc. SPIE 10977, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IX ISSN: 0277-786X ISSN: 1996-756X

Adrian Tulbure and Gheorghe Marc

DOI: https://doi.org/10.1117/12.2326484